Forschung
Lehre
Lösungen
DE
EN - English
CN - 中文
DE - Deutsch
ES - Español
KR - 한국어
IT - Italiano
FR - Français
PT - Português
TR - Türkçe
JA - 日本語
PL - Polski
RU - Русский
HE - עִברִית
AR - العربية
Anmelden
Materials Science Division
Sergey V. Baryshev has not added Biography.
If you are Sergey V. Baryshev and would like to personalize this page please email our Author Liaison for assistance.
High-resolution secondary ion mass spectrometry depth profiling of nanolayers.
Rapid communications in mass spectrometry : RCM Oct, 2012 | Pubmed ID: 22956313
Argonne National Laboratory
Sergey V. Baryshev1,
Robert A. Erck2,
Jerry F. Moore3,
Alexander V. Zinovev1,
C. Emil Tripa1,
Igor V. Veryovkin1
1Materials Science Division, Argonne National Laboratory,
2Energy Systems Division, Argonne National Laboratory,
3, MassThink LLC
Datenschutz
Nutzungsbedingungen
Richtlinien
Kontakt
BIBLIOTHEKS-EMPFEHLUNG
JoVE-Newsletter
JoVE Journal
Methodensammlungen
JoVE Encyclopedia of Experiments
Archiv
JoVE Core
JoVE Science Education
JoVE Lab Manual
JoVE Business
JoVE Quiz
JoVE Playlist
Autoren
Bibliothekare
Zugang
ÜBER JoVE
JoVE Sitemap
Copyright © 2025 MyJoVE Corporation. Alle Rechte vorbehalten