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In Situ SIMS and IR Spectroscopy of Well-defined Surfaces Prepared by Soft Landing of Mass-selected Ions

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10:22 min

June 16th, 2014

DOI :

10.3791/51344-v

June 16th, 2014


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Soft Landing

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0:05

Title

2:13

Mounting of COOH-SAM Surfaces on Gold for Soft Landing of Mass-selected Ions

3:07

Soft Landing of Mass-selected Ru(bpy)32+ onto COOH-SAM Surfaces

4:17

Analysis by In Situ TOF-SIMS Before and After Exposure to Reactive Gases

5:59

Analysis by In Situ FT-ICR-SIMS and IRRAS During and After Soft Landing

7:28

Results: Characterization of Organometallic Ions Soft Landed onto COOH-SAMs by In Situ SIMS and IR Spectroscopy

9:39

Conclusion

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